IMPEDANCE METER FOR SEMICONDUCTOR SURFACE CAPACITY MEASUREMENTS

Authors

  • János Mihály Soós
  • Mihály Fülöp

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How to Cite

Soós , J. M., Fülöp, M. “IMPEDANCE METER FOR SEMICONDUCTOR SURFACE CAPACITY MEASUREMENTS ”, Periodica Polytechnica Chemical Engineering, 17(2), pp. 135–138, 1973.

Issue

Vol. 17 No. 2 (1973)

Section

Articles